Title :
CMOS IC diagnostics using the luminescence of off-state leakage currents
Author :
Polonsky, Stas ; Jenkins, Keith A. ; Weger, Alan ; Cho, Shinho
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The light emission from ever increasing leakage currents in advanced CMOS technologies can now be reliably measured using existing photon detectors. The measurements of this emission provide valuable information about the operation of ICs. We suggest and experimentally demonstrate the following optical techniques: (1) transient logic state detection, (2) transient device temperature measurement, and (3) signal integrity analysis, including crosstalk and power supply noise measurements.
Keywords :
CMOS integrated circuits; CMOS logic circuits; integrated circuit testing; leakage currents; logic testing; luminescence; noise measurement; optical variables measurement; CMOS IC diagnostics; crosstalk measurements; light emission; luminescence; off-state leakage currents; optical techniques; photon detectors; power supply noise measurements; signal integrity analysis; transient device temperature measurement; transient logic state detection; CMOS integrated circuits; CMOS technology; Current measurement; Leak detection; Leakage current; Luminescence; Optical devices; Photonic integrated circuits; Stimulated emission; Transient analysis;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386945
