DocumentCode :
425613
Title :
Testing micropipelined asynchronous circuits
Author :
King, Matthew L. ; Saluja, Kewal K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
329
Lastpage :
338
Abstract :
Despite advances in the design of asynchronous circuits, little progress has been made in their testing or design for testability. This work proposes a new strategy for testing micropipelines, by treating the asynchronous elements, such as the C-element, as atomic state elements for testing purposes. By treating asynchronous elements as finite state machines, tests for these can be generated that verify their correct operation and also detect nearly all testable faults in the circuit. Design for testability methods for a micropipeline are also presented that reduce the amount of hardware added to the design while increasing its overall testability compared to other micropipeline testing methods.
Keywords :
asynchronous circuits; design for testability; fault diagnosis; finite state machines; C-element; asynchronous circuit design; asynchronous circuit testing; asynchronous elements; atomic state elements; design for testability; finite state machines; hardware reduction; micropipeline testing methods; micropipelined asynchronous circuits; Asynchronous circuits; Automata; Buildings; Circuit synthesis; Circuit testing; Clocks; Delay; Hardware; High performance computing; Prototypes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1386968
Filename :
1386968
Link To Document :
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