DocumentCode
425613
Title
Testing micropipelined asynchronous circuits
Author
King, Matthew L. ; Saluja, Kewal K.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
329
Lastpage
338
Abstract
Despite advances in the design of asynchronous circuits, little progress has been made in their testing or design for testability. This work proposes a new strategy for testing micropipelines, by treating the asynchronous elements, such as the C-element, as atomic state elements for testing purposes. By treating asynchronous elements as finite state machines, tests for these can be generated that verify their correct operation and also detect nearly all testable faults in the circuit. Design for testability methods for a micropipeline are also presented that reduce the amount of hardware added to the design while increasing its overall testability compared to other micropipeline testing methods.
Keywords
asynchronous circuits; design for testability; fault diagnosis; finite state machines; C-element; asynchronous circuit design; asynchronous circuit testing; asynchronous elements; atomic state elements; design for testability; finite state machines; hardware reduction; micropipeline testing methods; micropipelined asynchronous circuits; Asynchronous circuits; Automata; Buildings; Circuit synthesis; Circuit testing; Clocks; Delay; Hardware; High performance computing; Prototypes;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1386968
Filename
1386968
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