Title :
RF testing on a mixed signal tester
Author :
Brown, Dana ; Ferrario, John ; Wolf, Randy ; Li, Jing ; Bhagat, Jayendra
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Abstract :
In This work, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) used for this. A global positioning system (GPS) device is used as the example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, cost-effective and dedicated circuitry.
Keywords :
Global Positioning System; automatic test equipment; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; RF testing; automatic test equipment; global positioning system; mixed signal tester; radio frequency devices; Circuit testing; Costs; Current measurement; Global Positioning System; Integrated circuit testing; Packaging; Power measurement; RF signals; Radio frequency; System testing;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387342
