DocumentCode :
425731
Title :
Open architecture ATE: dream or reality?
Author :
Robinson, Gordon D.
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
1408
Abstract :
Several years ago, when discussion of open architecture semiconductor ATE was openly starting, the bar discussion agreed with that comment from a leading ATE architect. Since then, we have seen announcements, denouncements and many papers describing aspects of open architecture. Most semiconductor ATE systems allow some of the instruments to be used, but they have always seemed to be unwelcome intrusions into the systems. Such instrument standards have at times been described as "not being suitable for ATE systems". The current interest in open architecture ATE lead to several different outcomes.
Keywords :
automatic test equipment; open systems; instrument standards; open architecture ATE; semiconductor ATE systems; Application specific integrated circuits; Automatic testing; Costs; IEEE news; Instruments; Integrated circuit testing; Lead compounds; Open systems; Semiconductor device testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1387416
Filename :
1387416
Link To Document :
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