DocumentCode
425735
Title
Security vs. test quality: are they mutually exclusive?
Author
Kapur, Rohit
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
1414
Abstract
Scan technology does not provides controllability and observability in the IC, which could ease IP theft. Hence it is necessary not to eliminate scan chains but to add security to design-for-test (DFT) as a design constraint. Scan chains with decryption and encryption technology allow for scan chains to be used in security sensitive situations. Scan chains and hence high-quality test are implemented on ICs without compromising the IP on the chip.
Keywords
cryptography; design for testability; integrated circuit testing; DFT; IP theft; decryption; design for testability; encryption; high quality testing; integrated circuit testing; scan chains; scan technology; Automatic test pattern generation; Circuit testing; Cryptography; Decoding; Encoding; Flip-flops; Information security; Logic design; Logic testing; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387422
Filename
1387422
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