• DocumentCode
    425739
  • Title

    Dude! where´s my data? - cracking open the hermetically sealed tester

  • Author

    Daasch, Robert ; Rehani, Manu

  • Author_Institution
    IC Design & Test Lab., Portland State Univ., OR, USA
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    1428
  • Abstract
    ATE customers realize that testers that keep test data "hermetically sealed" in production mode are a barrier to profitability. This data is needed for process/yield improvement, adaptive control, product characterization, reliability improvement/burn-in elimination, test floor SPC, calibration, and test repeatability etc. Subcontractor and foundry manufacturing increases the complexity of getting the data. The views on this topic appear to fall into four camps: namely the traditionalist camp, the mainframe camp, the Wintel camp and the red hat camp.
  • Keywords
    automatic test equipment; hermetic seals; profitability; ATE customers; Wintel camp; adaptive control; burn-in elimination; calibration; hermetically sealed tester; mainframe camp; process improvement; product characterization; profitability; red hat camp; reliability improvement; test floor SPC; test repeatability; traditionalist camp; yield improvement; Hardware; Hermetic seals; Integrated circuit testing; Job production systems; Laboratories; Large scale integration; Logic design; Logic testing; Profitability; Software standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387436
  • Filename
    1387436