• DocumentCode
    425742
  • Title

    Diagnosis meets physical failure analysis: how long can we succeed?

  • Author

    Gattiker, Anne

  • Author_Institution
    IBM Austin Res. Lab., TX, USA
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    1441
  • Abstract
    Detecting real defects, increases the fabrication facility´s urgency to eliminate the source of the defect and gives assurance to the customer that the quality enhancement process is in action. Such satisfying moments may be more and more rare, however, as challenges to the physical failure analysis process make it increasingly difficult to get such pictures and as failure modes themselves become less amenable to the same. As challenges to physical failure analysis increasingly relegate it to a sampling/verification role, opportunities such as innovative use of process monitors and test structures and circuit-behavior/simulation-based pointers to failure root cause must increasingly be exploited and increasingly trusted as high-fidelity guide to yield learning.
  • Keywords
    failure analysis; fault simulation; integrated circuit testing; quality assurance; defect detection; fault simulation; integrated circuit testing; physical failure analysis; quality assurance; quality enhancement; Circuit faults; Circuit simulation; Circuit testing; Crosstalk; Fabrication; Failure analysis; Logic testing; Manufacturing processes; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387449
  • Filename
    1387449