DocumentCode :
425742
Title :
Diagnosis meets physical failure analysis: how long can we succeed?
Author :
Gattiker, Anne
Author_Institution :
IBM Austin Res. Lab., TX, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
1441
Abstract :
Detecting real defects, increases the fabrication facility´s urgency to eliminate the source of the defect and gives assurance to the customer that the quality enhancement process is in action. Such satisfying moments may be more and more rare, however, as challenges to the physical failure analysis process make it increasingly difficult to get such pictures and as failure modes themselves become less amenable to the same. As challenges to physical failure analysis increasingly relegate it to a sampling/verification role, opportunities such as innovative use of process monitors and test structures and circuit-behavior/simulation-based pointers to failure root cause must increasingly be exploited and increasingly trusted as high-fidelity guide to yield learning.
Keywords :
failure analysis; fault simulation; integrated circuit testing; quality assurance; defect detection; fault simulation; integrated circuit testing; physical failure analysis; quality assurance; quality enhancement; Circuit faults; Circuit simulation; Circuit testing; Crosstalk; Fabrication; Failure analysis; Logic testing; Manufacturing processes; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1387449
Filename :
1387449
Link To Document :
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