Title :
Diagnosis meets physical failure analysis: what is needed to succeed?
Author :
Venkataraman, S.
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
The process of root-causing failures is necessary and critical for ICs given both aggressive designs and new manufacturing processes. Economic considerations makes the whole root-causing process better, faster and cheaper. Progress requires development not just on individual tools but on the whole global process.
Keywords :
failure analysis; fault diagnosis; integrated circuit testing; IC testing; economic considerations; fault diagnosis; manufacturing processes; physical failure analysis; root-causing failures; Continuous improvement; Failure analysis; Geometry; Information analysis; Logic design; Manufacturing industries; Manufacturing processes; Performance analysis; Process design; Silicon;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387450
