DocumentCode
425743
Title
Diagnosis meets physical failure analysis: what is needed to succeed?
Author
Venkataraman, S.
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
1442
Abstract
The process of root-causing failures is necessary and critical for ICs given both aggressive designs and new manufacturing processes. Economic considerations makes the whole root-causing process better, faster and cheaper. Progress requires development not just on individual tools but on the whole global process.
Keywords
failure analysis; fault diagnosis; integrated circuit testing; IC testing; economic considerations; fault diagnosis; manufacturing processes; physical failure analysis; root-causing failures; Continuous improvement; Failure analysis; Geometry; Information analysis; Logic design; Manufacturing industries; Manufacturing processes; Performance analysis; Process design; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387450
Filename
1387450
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