DocumentCode :
426041
Title :
Nano-assembly of DNA based electronic devices using atomic force microscopy
Author :
Guangyong Li ; Xi, Ning ; Chen, Heping ; Li, Guangyong ; Fung, Carmen K M ; Chan, Rosa H M ; Zhang, Mingjun ; Tzyh-Jong Tarn
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
1
fYear :
2004
fDate :
28 Sept.-2 Oct. 2004
Firstpage :
583
Abstract :
DNA electronics circuits require an efficient way to accurately position and individually manipulate DNA molecules. The recent development of atomic force microscopy (AFM) seems to be a promising solution. We have recently developed an AFM based augmented reality system. This new system can provide both real-time force feedback and real-time visual feedback during nanomanipulation. We have shown that nano-imprinting and manipulation of nano-particles and nano-rods can be easily performed under assistance of the augmented reality system. In this research, the system´s ability is extended to manipulation of DNA molecules. Using a polynomial fitting method, the deformation of DNA molecules is displayed in real time in the augmented reality system during manipulation. Indeed, DNA molecules adopt many different structures including kinks, bends, bulges and distortions. These different structures and inappropriate physical contacts may result in the controversy of DNA conductivity reported over the last decade. The AFM based nanomanipulation system can be used either as a nanolithography tool to make small gap electrodes or a nanomanipulation tool to elongate, deform and cut DNA molecules. The measurement of the conductivity of DNA molecules in their different shapes and structures is a promising method to find conclusive evidences, which verify the electrical conductivity of DNA molecules.
Keywords :
DNA; atomic force microscopy; augmented reality; electrical conductivity measurement; electrodes; force feedback; microassembling; micromanipulators; nanolithography; DNA conductivity; DNA electronics circuit; atomic force microscopy; augmented reality system; conductivity measurement; electrical conductivity; nanoassembly; nanoimprinting; nanoparticle; nanorod; polynomial fitting method; real-time force feedback; real-time visual feedback; Atomic force microscopy; Augmented reality; Conductivity; DNA; Electron microscopy; Electronic circuits; Force feedback; Nanoscale devices; Real time systems; Shape measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Robots and Systems, 2004. (IROS 2004). Proceedings. 2004 IEEE/RSJ International Conference on
Print_ISBN :
0-7803-8463-6
Type :
conf
DOI :
10.1109/IROS.2004.1389415
Filename :
1389415
Link To Document :
بازگشت