• DocumentCode
    42761
  • Title

    Wearout Resilience in NoCs Through an Aging Aware Adaptive Routing Algorithm

  • Author

    Ancajas, Dean Michael ; Bhardwaj, Kshitij ; Chakraborty, Koushik ; Roy, Sanghamitra

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Utah State Univ., Logan, UT, USA
  • Volume
    23
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    369
  • Lastpage
    373
  • Abstract
    Continuous technology scaling has made aging mechanisms, such as negative bias temperature instability and electromigration primary concerns in network-on-chip (NoC) designs. In this paper, we extensively analyze the effects of these aging mechanisms on NoC routers and links. We observe a critical need of a robust aging-aware routing algorithm that not only reduces power-performance overheads caused due to aging degradation, but also minimizes the stress experienced by heavily utilized routers and links. To solve this problem, we propose an aging-aware adaptive routing algorithm and a router microarchitecture that routes the packets along the paths, which are both least congested and experience minimum aging degradation. After an extensive experimental analysis using real workloads, we observe 13% and 12.17% average overhead reduction in network latency and energy-delay product per flit, a 10.4% improvement in performance, and a 60% improvement in mean time to failure using our aging-aware routing algorithm.
  • Keywords
    negative bias temperature instability; network routing; network-on-chip; NoC; aging aware adaptive routing algorithm; continuous technology scaling; negative bias temperature instability; network-on-chip; router microarchitecture; wearout resilience; Aging; Algorithm design and analysis; Circuit faults; Degradation; Delays; Fault tolerance; Routing; Multicore processing; multiprocessor interconnection networks; parallel architecture; parallel architecture.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2305335
  • Filename
    6775326