An Analysis on the Optimization of Closed-Loop Detection Method for Optical Voltage Sensor Based on Pockels Effect

Author

Hui Li ; Liyang Cui ; Zhili Lin ; LiJing Li ; Chunxi Zhang

Author_Institution

Sch. of Instrum. Sci. & Optoelectron. Eng., Beihang Univ., Beijing, China

Volume

32

Issue

5

fYear

2014

fDate

1-Mar-14

Firstpage

1006

Lastpage

1013

Abstract

In engineering practice, the closed-loop optical voltage sensor (OVS) based on Pockels effect cannot reach the required precision level mainly due to the various disturbance and noise of system, so the application of OVS for low voltage measurement is restricted. Considering the cross coupling of the main and second closed-loops, the model of disturbance and noise of system that adopts the four-state modulation method is analyzed in the main closed-loop of OVS. Based on the established noise-perturbed stochastic model of OVS, we design a closed-loop detection algorithm for the OVS system to guarantee the mean-square exponential stability with a prescribed H_∞ performance in order to optimize the detection precision of OVS. The experimental results show that the detection precision of OVS is 0.144 V while the relative measurement error of the scale factor is within ± 0.15% in measuring low AC voltages from 140 to 500 V, which verifies the effectiveness of the proposed detection scheme.

Keywords

H^∞ optimisation; Pockels effect; optical modulation; optical noise; optical sensors; stochastic processes; voltage measurement; H_∞ performance; Pockels effect; closed-loop detection algorithm; cross coupling; four-state modulation method; low voltage measurement; mean-square exponential stability; noise-perturbed stochastic model; optical voltage sensor; optimization analysis; relative measurement error; system disturbance; system noise; voltage 0.144 V; voltage 140 V to 500 V; Cooperative systems; Diversity methods; Fading; Interference; Protocols; Relays; Signal to noise ratio; Optical voltage sensor; closed-loop detection; detection precision;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2013.2296518

Filename

6697876