DocumentCode :
428943
Title :
Characterization of homogenous TM nonlinear waveguide sensors
Author :
Abadla, M.M. ; Shabat, M.M.
Author_Institution :
Dept. of Phys., Al-Aqsa Univ., Gaza, Palestinian Authority
Volume :
1
fYear :
2004
fDate :
4-6 Oct. 2004
Lastpage :
236
Abstract :
This work is devoted on a three-layer sensor bounded from one side by a nonlinear clad of intensity dependent refractive index. A normalized analysis of sensitivity of this configuration and the condition to maximize this sensitivity is introduced. Behavior of sensing sensitivity is accounted for through power flow and cut-off considerations. We establish a method of determining the proper dimensioning of the sensor to execute its maximum sensitivity. We found that the sensitivity is higher in nonlinear sensors than in linear case in spite of appearing at lower wave guiding widths so that nonlinear sensors are advisable in accurate sensing.
Keywords :
nonlinear optics; optical sensors; refractive index; sensitivity; terrain mapping; waveguides; TM sensors; intensity dependence; maximum sensitivity; nonlinear clad; nonlinear optics; nonlinear sensors; nonlinear waveguide sensors; optical sensors; power cut-off; power flow; refractive index; sensing sensitivity; sensitivity analysis; sensor dimensioning; three-layer sensor; waveguides; Electromagnetic waveguides; Equations; Nonlinear optics; Optical films; Optical refraction; Optical sensors; Optical signal processing; Optical surface waves; Optical waveguides; Sensor phenomena and characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
Print_ISBN :
0-7803-8499-7
Type :
conf
DOI :
10.1109/SMICND.2004.1402849
Filename :
1402849
Link To Document :
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