DocumentCode :
4290
Title :
A Microwave Reflection Readout Scheme for Hot Electron Bolometric Direct Detector
Author :
Shurakov, Alexander ; Tong, Cheuk-yu Edward ; Grimes, Paul ; Blundell, Raymond ; Golt´sman, Gregory
Author_Institution :
Moscow State Pedagogical Univ., Moscow, Russia
Volume :
5
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
81
Lastpage :
84
Abstract :
In this paper, we propose and present data from a fast THz detector based on the repurpose of hot electron bolometer mixers (HEB) fabricated from superconducting NbN thin film. This detector is essentially a traditional NbN bolometer element that operates under the influence of a microwave pump. The injected microwave power serves the dual purpose of enhancing the detector sensitivity and reading out the impedance changes of the device in response to incident THz radiation. We have measured an optical Noise Equivalent Power of 4 pW/ √Hz for our detector at a bath temperature of 4.2 K. The measurement frequency was 0.83 THz and the modulation frequency was 1.48 kHz. The readout scheme is versatile and facilitates both high-speed operation as well as multi-pixel applications.
Keywords :
bolometers; microwave detectors; microwave measurement; microwave propagation; niobium compounds; readout electronics; superconducting microwave devices; superconducting mixers; superconducting thin films; terahertz wave detectors; thin film sensors; HEB mixers; NbN; THz detector; THz radiation; frequency 0.83 THz; frequency 1.48 kHz; hot electron bolometer; hot electron bolometric direct detector; microwave pump; microwave reflection readout scheme; multi-pixel applications; noise equivalent power; optical NEP measurement; superconducting thin film; temperature 4.2 K; Bolometers; Detectors; Frequency modulation; Microwave measurement; Mixers; Temperature measurement; Voltage measurement; Hot electron bolometer (HEB); THz detector; microwave readout; superconducting detector;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2014.2370736
Filename :
7001662
Link To Document :
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