DocumentCode :
429087
Title :
Adaptive interference cancel filter for evoked potential using high-order cumulants
Author :
Lin, Bor-Shyh ; Lin, Bor-Shing ; Chong, Fok-Ching ; Lai, Feipei
Author_Institution :
Inst. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
1
fYear :
2004
fDate :
1-5 Sept. 2004
Firstpage :
396
Lastpage :
398
Abstract :
This paper is to present evoked potential (EP) processing using adaptive interference cancel (AIC) filter with second and high order cumulants. In conventional ensemble averaging method, people have to conduct repetitively experiments to record the required data. Recently, the use of AIC structure with second statistics in processing EP has proved more efficiency than traditional averaging method, but it is sensitive to both of the reference signal statistics and the choice of step size. Thus, we proposed higher order statistics-based AIC method to improve these disadvantages. This study was experimented in somatosensory EP corrupted with EEG. Gradient type algorithm is used in AIC method. Comparisons with AIC filter on second, third, fourth order statistics are also presented in this paper. We observed that AIC filter with third order statistics has better convergent performance for EP processing and is not sensitive to the selection of step size and reference input.
Keywords :
adaptive filters; bioelectric potentials; electroencephalography; medical signal processing; somatosensory phenomena; EEG; adaptive interference cancel filter; ensemble averaging method; evoked potential processing; gradient type algorithm; high-order cumulants; somatosensory evoked potential; Adaptive filters; Audio recording; Brain cells; Electroencephalography; Higher order statistics; Interference cancellation; Least mean square algorithms; Nervous system; Signal processing; Skin; adaptive interference cancel filter; evoked potential; high order cumulants;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
Type :
conf
DOI :
10.1109/IEMBS.2004.1403177
Filename :
1403177
Link To Document :
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