• DocumentCode
    429193
  • Title

    Bootstrap-based statistical thresholding for MEG source reconstruction images

  • Author

    Sekihara, Kensuke ; Sahani, Maneesh ; Nagarajan, Srikantan S.

  • Author_Institution
    Tokyo Metropolitan Inst. of Technol., Japan
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    1018
  • Lastpage
    1021
  • Abstract
    This work proposes a bootstrap-based statistical method for extracting target source activities from MEG/EEG source reconstruction results. The method requires measurements in a control condition, which contains only nontarget source activities. The method derives, at each pixel location, an empirical probability distribution of the nontarget source activity using bootstrapped reconstruction obtained from the control period. The statistical threshold that can extract the target source activities is derived based on the empirical distributions obtained from all pixel locations. Here, the multiple comparison problem is taken into account by using two step procedure: studentizing these empirical distributions and deriving an empirical distribution of the maximum pseudo T value at each pixel location. The results of numerical experiments are presented to demonstrate the method´s effectiveness.
  • Keywords
    electroencephalography; image reconstruction; magnetoencephalography; medical image processing; neurophysiology; statistical distributions; statistical testing; EEG source reconstruction; MEG source reconstruction image; bootstrap-based statistical thresholding; empirical probability distribution; statistical significance test; Coils; Current measurement; Electroencephalography; Image reconstruction; Magnetic field measurement; Neuroscience; Probability distribution; Radiology; Spatial filters; Time measurement; Bootstrap method; MEG; Source reconstruction; Statistical significance test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403335
  • Filename
    1403335