DocumentCode :
42956
Title :
Control of the Microstructure of FePt-SiN _{\\rm x} -C (001) Film by a Nucleation Layer Grown on TiN Intermediate Layer
Author :
Li, Hai Helen ; Dong, K.F. ; Chow, G.M. ; Chen, Jim S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume :
49
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
3299
Lastpage :
3302
Abstract :
The microstructure and magnetic properties of granular FePt-SiNx-C films were modified by introducing an MgO nucleation layer grown on the TiN intermediate layer. It was found that the deposition of an ultra-thin MgO nucleation layer could reduce the FePt grain size, narrow grain size distribution and improve grain isolation by creating more nucleation sites. When MgO nucleation layer thickness varied from 0 to 0.36 nm, FePt grain size was reduced from 8.51 nm to 7.18 nm and the standard deviation of the grain size distribution was narrowed from 2.16 nm to 1.51 nm. Good L10 (001) texture was maintained and large out-of-plane coercivity (27.5 kOe) was obtained at the MgO thickness of 0.36 nm. Meanwhile, Δθ50 of FePt (001) peak decreased from 7.1° to 6.4°, indicating the improved easy axis distribution of FePt grains. However, with the further increase of the MgO nucleation layer thickness, MgO nuclei developed into a continuous layer, FePt (111) orientation appeared and the perpendicular magnetic anisotropy was deteriorated.
Keywords :
carbon; coercive force; crystal orientation; grain size; iron compounds; magnesium compounds; nucleation; perpendicular magnetic anisotropy; silicon compounds; thin films; titanium compounds; FePt (111) orientation; FePt-SiNx-C; MgO; MgO nucleation layer growth; TiN; TiN intermediate layer; continuous layer; grain isolation; grain size; granular films; magnetic properties; microstructure; out-of-plane coercivity; perpendicular magnetic anisotropy; size 0.36 nm; standard deviation; ultrathin MgO nucleation layer; Coercive force; Grain size; Magnetic hysteresis; Magnetic recording; Microstructure; Tin; X-ray scattering; FePt thin film; MgO nucleation layer; TiN intermediate layer; perpendicular magnetic media;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2013.2242433
Filename :
6559342
Link To Document :
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