Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Author

Tso, Hung-Ta ; Kuo, Chien-Nan

Author_Institution

Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2004

fDate

25-27 Oct. 2004

Firstpage

139

Lastpage

142

Abstract

An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. This probe convert signal from either a coaxial connector or waveguide into the test circuit under test to achieve impedance matching and field pattern matching. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

Keywords

coplanar transmission lines; coplanar waveguides; impedance matching; strip lines; waveguide couplers; 40 GHz; broadband characterization; coaxial connector; coplanar strip line test circuits; coplanar transmission lines; coplanar waveguides; field pattern matching; ground-signal-ground probe; impedance matching; miniaturized on-chip differential circuits; on-chip filter; shunt connection; silicon based filter; strip lines; waveguide connector; Circuit noise; Circuit testing; Coaxial components; Connectors; Distributed parameter circuits; Electronic equipment testing; Filters; Mutual coupling; Probes; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on

Print_ISBN

0-7803-8667-1

Type

conf

DOI

10.1109/EPEP.2004.1407567

Filename

1407567