Title :
Methodology to simulate delta-I noise interaction with interconnect noise for wide, on-chip data-buses using lossy transmission-line power-blocks
Author :
Deutsch, A. ; Smith, H.H. ; Rubin, B.J. ; Kraute, B.L. ; Kopcsay, G.V.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A new technique is described for reducing computational complexity and improve accuracy of power distribution and interconnect noise prediction for wide, on-chip data-buses. The methodology uses lossy transmission-line power-blocks with frequency-dependent properties needed for the multi-GHz clock frequencies. The interaction between delta-I noise, common-mode noise, and crosstalk is illustrated with simulations using representative driver and receiver circuits and on-chip interconnections.
Keywords :
circuit simulation; computational complexity; crosstalk; driver circuits; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; microprocessor chips; system buses; clock frequencies; common mode noise; computational complexity reduction; crosstalk; delta-I noise interaction simulation; driver circuits; interconnect noise prediction; lossy transmission line power blocks; microprocessor chips; on-chip data buses; on-chip interconnections; power distribution; receiver circuits; Circuit noise; Computational complexity; Computational modeling; Crosstalk; Frequency; Integrated circuit interconnections; Noise reduction; Power distribution; Propagation losses; Transmission lines;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
DOI :
10.1109/EPEP.2004.1407615