DocumentCode :
430209
Title :
The application of nonstandard support vector machine in tool condition monitoring system
Author :
Sun, J. ; Hong, G.S. ; Rahman, M. ; Wong, Y.S.
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
fYear :
2004
fDate :
28-30 Jan. 2004
Firstpage :
295
Lastpage :
300
Abstract :
When neural networks are utilized to identify tool states in machining process, the main interest is often on the recognition ability. It is usually believed that a higher classification rate from pattern recognition can improve the accuracy and reliability of tool condition monitoring (TCM), thereby reducing the manufacturing loss. Nevertheless, the two objectives are not identical in most practical manufacturing systems. The aim of this paper is to address this issue and propose a new evaluation function so that the recognition ability of TCM can be evaluated more reasonably. On this basis, two kinds of manufacturing loss due to misclassification are analyzed, and both of them are utilized to calculate corresponding weights in the evaluation function. Then, the potential manufacturing loss is introduced in this work to evaluate the recognition performance of TCM. On the basis of this evaluation function, a modified support vector machine (SVM) approach with two regularization parameters is utilized to learn the information of every tool state. The experimental results show that the proposed method can reliably carry out the identification of tool flank wear, reduce the overdue prediction of worn tool conditions and its relative loss.
Keywords :
condition monitoring; function evaluation; machine tools; machining; manufacturing systems; mechanical engineering computing; neural nets; pattern recognition; support vector machines; function evaluation; machining process; manufacturing loss reduction; manufacturing systems; mechanical engineering computing; neural networks; pattern recognition; support vector machine; tool condition monitoring system; tool flank wear identification; Artificial neural networks; Clustering algorithms; Condition monitoring; Decision making; Feature extraction; Fuzzy logic; Manufacturing; Pattern recognition; Signal processing; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
Type :
conf
DOI :
10.1109/DELTA.2004.10017
Filename :
1409855
Link To Document :
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