• DocumentCode
    430231
  • Title

    A technique for designing totally self-checking domino logic circuits

  • Author

    Tang, C.K. ; Lata, P.K. ; Parkerson, J.P.

  • Author_Institution
    Dept. of Comput. Sci. & Comput. Eng., Arkansas Univ., Fayetteville, AR, USA
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    128
  • Lastpage
    132
  • Abstract
    A scheme for concurrent self-checking domino logic circuit is proposed. The self-checking feature is achieved by transistor sharing of the original and its inverse functions and by using the outputs as 1-out-of-2 code. The sharing of transistors lowers the overhead required for the inverse function. A checker circuit is embedded into the self-checking implementation. The scheme is especially suitable for large CMOS domino logic circuits.
  • Keywords
    CMOS logic circuits; embedded systems; logic design; logic testing; 1-out-of-2 code; CMOS logic circuits; checker circuit; concurrent self-checking domino logic circuit; embedded circuit; inverse function; transistor sharing; CMOS logic circuits; Circuit faults; Electrical fault detection; Encoding; Fault detection; Logic circuits; Logic functions; Logic testing; Monitoring; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.14
  • Filename
    1410570