• DocumentCode
    430873
  • Title

    Inspection of defect on LCD panel using polynomial approximation

  • Author

    Baek, Seung-Il ; Kim, Woo-Seob ; Koo, Tak-Mo ; Choi, Il ; Park, Kil-Houm

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Taegu, South Korea
  • Volume
    A
  • fYear
    2004
  • fDate
    21-24 Nov. 2004
  • Firstpage
    235
  • Abstract
    Nowadays, the CRT display devices are rapidly substituted for LCD display devices. In LCD panel production, the inspection process relies on human vision. So, the results of inspection is likely to be subjective. Therefore, we need the automated inspection system for LCD devices by obtaining objective decision level. In this paper, we propose an efficient automated inspection algorithm using polynomial approximation and optimal thresholding technique. The experimental result shows us that our proposed system can have enough performance for substitution of human inspectors.
  • Keywords
    computer vision; inspection; liquid crystal displays; polynomial approximation; CRT display device; LCD panel; automated inspection system; computer vision; defect inspection; image flattening method; optimal thresholding technique; polynomial approximation; Computer displays; Costs; Equations; Humans; Inspection; Liquid crystal displays; Mean square error methods; Polynomials; Production; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2004. 2004 IEEE Region 10 Conference
  • Print_ISBN
    0-7803-8560-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2004.1414400
  • Filename
    1414400