Line parameters estimation by array processing methods [image line characterization applications]

The high resolution methods of array processing lead to an improvement of the results obtained for source localization. By adopting specific conventions, it is possible to employ high resolution methods to characterize straight lines in an image. In this paper, we propose an original method that leads to the estimation of the parameter "offset" of the straight lines. The proposed method is fast and effective compared to an existing method. An extension to non rectilinear contours is developed.