• DocumentCode
    432206
  • Title

    Development of strong elasticoluminescence from ferroelectric phase

  • Author

    Chao-Nan Xu ; Yamada, Hiroshi ; Wang, Xusheng ; Zheng, Xu-Guang

  • Author_Institution
    PRESTO, Japan Sci. & Technol. Agency, Saitama, Japan
  • Volume
    2
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    914
  • Abstract
    Recently, we have found a new phenomenon, named elasticoluminescence, in which intensive visible light can be emitted by the application of mechanical stress in the elastic deformation region. This phenomenon, contrary to piezoelectricity, can sense changes in mechanical stress without any electrical contacts or electrodes. Elastico-deformation luminescence has been investigated systematically using precisely controlled pure-phase of various oxides and their mixed phases. This study reveals that only certain ferroelectric phases produce strong elastico-deformation luminescence; other pure-phases of non-piezoelectricity show no deformation luminescence. Correlation of deformation luminescence and crystal structure has been found. This finding can be applied in designing strong elastico-deformation-luminescent materials. Strong elasticoluminescence materials and/or coatings can give real-time stress images, so that it is a prospective candidate for developing a new non-destructive evaluation technology.
  • Keywords
    elastic deformation; ferroelectric devices; luminescence; luminescent devices; stress effects; crystal structure; elastic deformation region; elastico-deformation luminescence; ferroelectric phase; mechanical stress; mechanoluminescence; nondestructive evaluation technology; nonpiezoelectricity; oxides; piezoelectricity; real-time stress images; strong elasticoluminescence; visible light; Chaos; Crystalline materials; Ferroelectric materials; Luminescence; Mechanical energy; Piezoelectricity; Powders; Solids; Stress; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2004 IEEE
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-8412-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2004.1417884
  • Filename
    1417884