Title :
Analysis of the SAW propagation in langasite crystal by X-ray topography
Author :
Roshchupkin, D.V. ; Roshchupkina, H.D. ; Irzhak, D.V. ; Buzanov, O.A.
Author_Institution :
Inst. of Microelectron. Technol., RAS, Chernogolovka, Russia
Abstract :
X-ray Bragg diffraction on the X, Y, and (011) cuts of a langasite crystal (La3Ga5SiO14, LGS) modulated by a Rayleigh surface acoustic wave (SAW) has been studied using a high-resolution X-ray topography method. This X-ray topography technique was used for direct imaging of the standing SAW in LGS, to measure the SAW amplitudes and power flow angles, to visualize the diffraction patterns in acoustic beams, and to study the process of the SAW interaction with crystal structure defects.
Keywords :
Rayleigh waves; X-ray topography; acoustic wave diffraction; acoustic wave propagation; crystal defects; surface acoustic wave devices; Bragg diffraction; LGS; La3Ga5SiO14; Rayleigh surface acoustic wave; SAW amplitudes; SAW propagation; acoustic beams; crystal structure defects; diffraction pattern visualization; direct imaging; high-resolution X-ray topography; langasite crystal; power flow angles; standing SAW; Acoustic diffraction; Acoustic imaging; Acoustic propagation; Acoustic waves; High-resolution imaging; Optical imaging; Surface acoustic waves; Surface topography; X-ray diffraction; X-ray imaging;
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
Print_ISBN :
0-7803-8412-1
DOI :
10.1109/ULTSYM.2004.1418009
