DocumentCode
432321
Title
The characteristics of leaky surface acoustic wave of proton-exchanged lithium tantalite
Author
Chung, Chung-Jen ; Chen, Ying-Chung ; Wei, Ching-Liang ; Kao, Kuo-Sheng ; Cheng, Chien-Chuan
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume
2
fYear
2004
fDate
23-27 Aug. 2004
Firstpage
1545
Abstract
Proton exchange (PE) is an attractive method for the fabrication of optical and acoustic waveguides in lithium tantalite (LiTaO3) substrate. Octanoic acid was used for the fabrication of PE LiTaO3 waveguides. After the PE process, the resultant substrate showed a damage-free surface from observations by scanning electron microscopy (SEM). And X-ray diffraction (XRD) was adopted to identify the crystalline structure of LiTaO3. From the X-ray diffraction (XRD) results, the reflection peak of (306) was shifted after the PE process. The influences of the exchanging time on properties of leaky surface acoustic wave (LSAW) devices were discussed. The single electrode geometry of interdigital transducers (IDT) was adopted to excite and receive the acoustic wave. The wavelength (λ) of the LSAW is 32 μm. The frequency response of the LSAW is measured using an HP 8720ET network analyzer. The velocity of LSAW was decreased as the increase of PE time; nevertheless, the range of variation was quite small. Measurements of the temperature dependence of LSAW velocity were carried in the temperature range from 0°C to 80°C. The temperature coefficient of frequency (TCF) of LSAW devices was significantly increased by the increase of PE time. The PE process changed the characteristics of material and specific property can be obtained.
Keywords
X-ray diffraction; interdigital transducers; ion exchange; lithium compounds; scanning electron microscopy; surface acoustic wave devices; 0 to 80 degC; 32 micron; LSAW devices; LiTaO3; LiTaO3 substrate; SEM; X-ray diffraction; XRD; damage-free surface; interdigital transducers; leaky surface acoustic wave; octanoic acid; proton-exchanged lithium tantalite; scanning electron microscopy; temperature coefficient of frequency; temperature dependence; Acoustic diffraction; Acoustic waveguides; Acoustic waves; Lithium; Optical device fabrication; Optical surface waves; Optical waveguides; Scanning electron microscopy; Surface acoustic waves; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2004 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-8412-1
Type
conf
DOI
10.1109/ULTSYM.2004.1418098
Filename
1418098
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