DocumentCode
432383
Title
Investigation of pulsed HV breakdown between treated stainless steel and aluminum electrodes with 2 to 8 mm gaps
Author
Johnson, D.J. ; Savage, Mark E. ; Sharpe, R.A. ; Proskurovsky, D.I. ; Batrakov, A.V.
Author_Institution
Sandia National Laboratories, Albuquerque, New Mexico 87185
Volume
1
fYear
2004
fDate
Sept. 27 2004-Oct. 1 2004
Firstpage
88
Lastpage
91
Abstract
The paper describes an investigation of the HV breakdown mechanism between stainless steel and aluminum electrodes. The stainless steel electrodes have been treated with pulsed e-beam surface melting (EBEST), hydrogen vacuum furnace firing (HVFF), mechanical polish, and given a chromium oxide coating. The aluminum electrodes with various surface roughness and anodized coatings are also studied. Electrodes are cleaned in a littered clean air environment to minimize effects of air-born micro-particles. Breakdown tests were performed with a 160-ns- FWHM, l-cos(wt), voltage pulse of up to a 500 kV. The tests show that the breakdown voltage drops approximately as the square root of the gap for metal surfaces with gaps between 2 and 8 mm. The hold-off is about 1 MV/cm for 2.5 mm gaps for EBEST and mechanically polished stainless steel and 20% smaller for polished and machined aluminum. The standard model to explain this dependence of breakdown requires minute particles to cross the gap and initiate breakdown by forming plasma 011 impact to an electrode. For the short pulses used here the particles would need to be nanoparticles with only few hundred atoms. Optical diagnostics of breakdown arcs is presented to shed light on the perplexing physics limiting HV hold-off in these tests.
Keywords
Aluminum; Breakdown voltage; Electric breakdown; Electrodes; Optical pulses; Steel; Stimulated emission; Surface cleaning; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
Conference_Location
Yalta, Crimea
ISSN
1093-2941
Print_ISBN
0-7803-8461-X
Type
conf
DOI
10.1109/DEIV.2004.1418608
Filename
1418608
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