• DocumentCode
    432591
  • Title

    New trends for multiharmonic source-pull and load-pull measurements

  • Author

    Lenoir, S. ; Fouquet, F. ; Tolant, C. ; Eudeline, P. ; Mazari, B.

  • Volume
    2
  • fYear
    2004
  • fDate
    12-14 Oct. 2004
  • Firstpage
    681
  • Lastpage
    684
  • Abstract
    An original measurement method for nonlinear device "Source-Pull" characterization is proposed. It allows faster device characterization compared to conventional techniques. The whole chart representations are extrapolated from few measurements by computation. The new method has been validated on a test bench. This paper explains the method and shows the validation process. We also show the impact of the topologies of Multiharmonic Source-Pull and Load-Pull benches.
  • Keywords
    Character generation; Equations; Impedance; Power generation; Power measurement; Reflection; Shape measurement; Testing; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2004. 34th European
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    1-58053-992-0
  • Type

    conf

  • Filename
    1418909
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=432591