Title :
An efficient method for the measurement of the scattering-parameters of multi-ports with a two-port network-analyzer
Author :
Rolfes, I. ; Schiek, B.
Abstract :
The multi-port method for the measurement of the scattering parameters of N-port devices with M-port vector network analyzers (VNA) with M\n\n\t\t
Keywords :
Calibration; Circuit topology; Error correction; Impedance; Performance analysis; Performance evaluation; Scattering parameters; Switches; Testing; Vectors;
Conference_Titel :
Microwave Conference, 2004. 34th European
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
1-58053-992-0
