DocumentCode
432651
Title
Characterisation of european millimetre-wave planar diodes
Author
Mottonen, V.S. ; Mallat, Juha ; Raisanen, Antti V.
Author_Institution
MilliLab, Radio Laborator/SMARAD, Helsinki University of Technology, P.O. Box 3000, FI-02015 HUT, Finland
Volume
2
fYear
2004
fDate
12-14 Oct. 2004
Firstpage
921
Lastpage
924
Abstract
This paper describes a process for characterisation of millimetre-wave planar diode chips. It comprises dc-characteristics, capacitance, and wide-band (7-220 GHz) scattering parameter measurements and parameter extractions from measurement results. As the first test items, we have characterised planar Schottky diode chips (varactor and mixer diodes) fabricated by Technical University of Darmstadt. We describe a coplanar waveguide test mount design applied for the measurements and show the measured and extracted results. The S-parameters at 7-220 GHz are obtained for several different bias voltages and currents.
Keywords
Capacitance measurement; Circuit testing; Coplanar waveguides; Current measurement; Electrical resistance measurement; Parasitic capacitance; Scattering parameters; Schottky diodes; Semiconductor device measurement; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2004. 34th European
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
1-58053-992-0
Type
conf
Filename
1418978
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