Title :
Method for separating dielectric surface loss terms on CVD-diamond disks
Author :
Danilov, I. ; Heidinger, R. ; Meier, A.
Author_Institution :
Inst. fur Materialforschung, Forschungszentrum Karlsruhe, Germany
fDate :
27 Sept.-1 Oct. 2004
Abstract :
The separation and quantification of dielectric surface losses are achieved by measuring chemical vapour deposition (CVD) diamond disks both in hemispherical and symmetrical open resonators for arbitrary thickness of the disks. The measurement data are modelled by expressions based on impedance transformation (IT) theory to describe the contribution of each surface to the total loss.
Keywords :
CVD coatings; diamond; dielectric loss measurement; dielectric resonators; millimetre wave measurement; C; CVD diamond disks; chemical vapour deposition; dielectric surface loss separation; hemispherical open resonators; impedance transformation theory; millimetre wave measurement; symmetrical open resonators; Chemical vapor deposition; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Loss measurement; Permittivity measurement; Propagation losses; Q factor; Thickness measurement;
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422030
