Prism-shaped Fabry-Perot etalon for absorption measurement in the terahertz range

Author

Beigang, René ; Dobroiu, Adrian ; Otani, Chiko ; Kawase, Kodo

Author_Institution

Dept. of Phys., Tech. Univ. of Kaiserslautern, Germany

fYear

2004

fDate

27 Sept.-1 Oct. 2004

Firstpage

547

Lastpage

548

Abstract

A solid-state prism-shaped Fabry-Perot interferometer allows absorption measurements using a backward wave oscillator (BWO) continuous-wave source in the terahertz range. When a liquid sample is placed on the prism surface it affects the total internal reflection, thus it can be considered as being optically inside the cavity. The wavelength is scanned and the spectra obtained are Fourier analyzed for the absorption determination.

Keywords

Fabry-Perot interferometers; Fabry-Perot resonators; absorption coefficients; backward wave oscillators; elemental semiconductors; optical prisms; optical variables measurement; silicon; submillimetre wave measurement; submillimetre wave oscillators; BWO; absorption coefficient measurements; backward wave oscillator; continuous wave source; prism shaped Fabry Perot interferometer; prism shaped Fabry-Perot etalon; silicon prism; solid state Fabry-Perot resonator; terahertz range measurement; total internal reflection; wavelength scanning; Absorption; Biomedical optical imaging; Fabry-Perot; Mirrors; Optical reflection; Optical resonators; Optical surface waves; Silicon; Submillimeter wave measurements; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on

Print_ISBN

0-7803-8490-3

Type

conf

DOI

10.1109/ICIMW.2004.1422206

Filename

1422206