Cyclotron emission imaging of quantum Hall devices

Author

Ikushima, K. ; Sakuma, H. ; Yoshimura, Y. ; Komiyama, S. ; Ueda, T. ; Hirakawa, K.

Author_Institution

Dept. of Basic Sci., Tokyo Univ., Japan

fYear

2004

fDate

27 Sept.-1 Oct. 2004

Firstpage

557

Lastpage

558

Abstract

The current state of highly sensitive terahertz imaging microscopes is reported in the context of applications for cyclotron emission studies of quantum Hall devices. Without external excitation other than the transport current, the microscope maps the distribution of nonequilibrium electrons generated in quantum devices by detecting weak cyclotron emission. Firstly, we present the imaging results to discuss the origin of nonequilibrium electrons. Finally, we describe our attempts towards photon counting terahertz microscope with quantum-dot photon detectors utilizing single electron transistors.

Keywords

Hall effect devices; cyclotron radiation; photodetectors; photon counting; scanning electron microscopes; semiconductor quantum dots; single electron transistors; submillimetre wave imaging; cyclotron emission imaging; highly sensitive terahertz imaging microscopes; nonequilibrium electron distribution; photon counting terahertz microscope; quantum Hall devices; quantum dot photon detectors; single electron transistors; weak cyclotron emission detection; Cyclotrons; Detectors; Electron emission; Electron microscopy; Lenses; Optical imaging; Quantum dots; Single electron transistors; Spatial resolution; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on

Print_ISBN

0-7803-8490-3

Type

conf

DOI

10.1109/ICIMW.2004.1422211

Filename

1422211