DocumentCode
434082
Title
Contactless determination of transport parameters of semiconductor two-dimensional systems using magnetic quantum effects
Author
Kornilovich, A.A.
fYear
2004
fDate
21-24 Sept. 2004
Firstpage
213
Lastpage
213
Abstract
In this paper, based on the investigation of the Shubnikov-de Haas and cyclotron resonance effects in two-dimensional (2D) semiconductor systems such as GaAs / Al/sub x/ Ga/sub 1-x/ As, by relative contactless measuring of the derivative reflection coefficient microwave radiation the carrier concentration, mobility, relaxation time and Hall-resistance in the 2D layers GaAs to be determined an accuracy of 0,5%. The contactless method of the determination of the coefficient filling and the plateau boundary in the quantum Hall effect is proposed
Keywords
Cyclotrons; Filling; Gallium arsenide; Hall effect; Magnetic resonance; Magnetic semiconductors; Microwave measurements; Silicon; Time measurement; Weight control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location
Novosibirsk, Russia
Print_ISBN
0-7803-8476-8
Type
conf
Filename
1427220
Link To Document