• DocumentCode
    434313
  • Title

    Volt-amper characteristics parameters research of the power semiconductor devices in the conditions of low conducting ability.

  • Author

    Bespalov, N.N. ; Trofimov, N.V.

  • fYear
    2004
  • fDate
    21-24 Sept. 2004
  • Firstpage
    268
  • Lastpage
    268
  • Abstract
    The models of static and dynamic volt-amper semiconductor devices in the conditions of low conducting ability with different values of operating temperature have been elaborated. The evaluation of the approximate error of the power semiconductor devices and the demands to their measuring modes have also adduced.
  • Keywords
    Power generation; Power measurement; Power semiconductor devices; Power system modeling; Pulse width modulation; Pulse width modulation converters; Semiconductor device measurement; Semiconductor devices; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
  • Conference_Location
    Novosibirsk, Russia
  • Print_ISBN
    0-7803-8476-8
  • Type

    conf

  • Filename
    1427478