Title :
Emission measurements of microcontrollers
Author :
Steinecke, Thomas
Author_Institution :
Infineon Technol. AG, Muenchen
Abstract :
The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour
Keywords :
IEC standards; application specific integrated circuits; electromagnetic compatibility; integrated circuit testing; measurement standards; microcontrollers; ASIC manufacturers; EMC; IEC 61967; SAE; VDE; clocked semiconductor devices; electromagnetic emission characterization; international standard; microcontroller emission measurements; near field scan; semiconductor manufacturers; test standards; Application specific integrated circuits; Clocks; Electromagnetic devices; Electromagnetic measurements; IEC standards; Microcontrollers; Pulp manufacturing; Semiconductor device manufacture; Semiconductor device testing; Semiconductor devices;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1428203