Title :
Probabilistic bounds for model invalidation assessment
Author :
Liu, Wenguo ; Chen, Jie
Author_Institution :
Dept. of Electr. Eng., California Univ., Riverside, CA, USA
Abstract :
This paper is concerned with a mixed deterministic/probabilistic model invalidation problem, which amounts to determining the probability for a given model to reproduce some given experimental data. We consider an additive uncertain model, in which the modelling uncertainty is characterized in time domain by the l1 induced system norm. The data available for invalidation are input-output time series and are assumed to have been corrupted by a random noise with Gaussian distribution. For a given uncertainty norm bound, our objective is to compute the probability for no uncertainty to exist that may satisfy the prescribed bound and match the input-output measurements. While the exact computation of this probability may pose a formidable task, we derive its upper and lower bounds.
Keywords :
Gaussian distribution; identification; probability; random noise; time series; uncertain systems; Gaussian distribution; additive uncertain model; deterministic model invalidation problem; input-output time series; l/sub 1/ induced system norm; model invalidation assessment; modelling uncertainty; probabilistic bounds; probabilistic model invalidation problem; random noise; time domain; Control systems; Frequency domain analysis; Gaussian distribution; Gaussian noise; Impedance matching; Linear matrix inequalities; Mathematical model; Noise measurement; Testing; Uncertainty;
Conference_Titel :
Decision and Control, 2004. CDC. 43rd IEEE Conference on
Conference_Location :
Nassau
Print_ISBN :
0-7803-8682-5
DOI :
10.1109/CDC.2004.1428658