DocumentCode
434775
Title
Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials
Author
Materassi, D. ; Basso, M. ; Genesio, R.
Author_Institution
Dipt. di Sistemi e Informatica, Univ. di Firenze, Italy
Volume
3
fYear
2004
fDate
14-17 Dec. 2004
Firstpage
3059
Abstract
The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.
Keywords
atomic force microscopy; harmonic analysis; micropositioning; nonlinear control systems; atomic force microscopes; common tip-sample interaction potentials; frequency analysis; harmonic balance analysis; nonlinear known phenomena; repulsive-attractive interaction potentials; separation-amplitude curve; tapping mode; Atomic force microscopy; Biological system modeling; Biomedical optical imaging; Frequency; Harmonic analysis; Image resolution; Instruments; Nanobioscience; Nanoscale devices; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2004. CDC. 43rd IEEE Conference on
ISSN
0191-2216
Print_ISBN
0-7803-8682-5
Type
conf
DOI
10.1109/CDC.2004.1428934
Filename
1428934
Link To Document