DocumentCode
434827
Title
Influence of operation- and program-states on the breakdown effects of electronics by impact of EMP and UWB
Author
Camp, Michael ; Garbe, Heyno
Volume
2
fYear
2003
fDate
11-16 May 2003
Firstpage
1032
Lastpage
1035
Keywords
Bandwidth; Circuit testing; EMP radiation effects; Electric breakdown; Electromagnetic measurements; Electromagnetic transients; Electromagnetic waveguides; Magnetic field measurement; Pulse measurements; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN
0-7803-7779-6
Type
conf
DOI
10.1109/ICSMC2.2003.1429090
Filename
1429090
Link To Document