Study on the failure mechanism of the electronic device in the transient electromagnetic field

This article introduces many kinds of interference and damage tests of electronic equipments, automatics and electric device in the transient electromagnetic field and steady-state electromagnetic field, and has got a series of interference phenomena and results of the tests. We have carried on the analysis of inside effect and mechanism on the outside electromagnetic field acting on the electronic device. Carrier movement law and thermal effect within the electronic device are the main reasons for causing the electronic device failure and damage after studying under electromagnetic field function. We draw a series of important conclusions that the different intensities of field and different devices receive interference and failure.