• DocumentCode
    434833
  • Title

    A genetic algorithm based interconnect discontinuity model for multi-Gb/s circuits

  • Author

    Erdin, Ihsan

  • Author_Institution
    Nortel Networks, Ottawa, Ont., Canada
  • Volume
    2
  • fYear
    2003
  • fDate
    11-16 May 2003
  • Firstpage
    1129
  • Abstract
    A genetic algorithm-based method is presented to model the interconnect discontinuities in multi-Gb/s systems. In the proposed algorithm, only the s11-parameter of a discontinuity is needed. The data can be obtained either from measurements or 3D-electromagnetic simulations. The measurement/simulation results are processed with genetic algorithm optimization technique (GAOT) to compute the values of lumped circuit components that model the discontinuity. Eliminating the need for measurement/simulation and post-processing for all entries of the S-parameter matrix as well as de-embedding, the proposed algorithm improves the computational cost while preserving the accuracy of the model. The results of the algorithm show good agreement to measurements.
  • Keywords
    S-matrix theory; S-parameters; SPICE; circuit optimisation; genetic algorithms; integrated circuit interconnections; lumped parameter networks; strip line discontinuities; 3D-electromagnetic simulations; S-parameter matrix; SPICE; computational cost; de-embedding; genetic algorithm optimization technique; interconnect discontinuity model; lumped circuit components; multiGb/s circuits; Circuit simulation; Electromagnetic measurements; Genetic algorithms; Impedance; Integrated circuit interconnections; Pollution measurement; Propagation constant; Scattering parameters; Transmission line discontinuities; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7779-6
  • Type

    conf

  • DOI
    10.1109/ICSMC2.2003.1429115
  • Filename
    1429115