DocumentCode :
435020
Title :
Hierarchical decision making in semiconductor fabs using multi-time scale Markov decision processes
Author :
Panigrahi, Jnana Ranjan ; Bhatnagar, Shalabh
Author_Institution :
Dept. of Comput. Sci. & Autom., Indian Inst. of Sci., Bangalore, India
Volume :
4
fYear :
2004
fDate :
14-17 Dec. 2004
Firstpage :
4387
Abstract :
There are different timescales of decision making in semiconductor fabs. While decisions on buying/discarding of machines are made on the slower timescale, those that deal with capacity allocation and switchover are made on the faster timescale. We formulate this problem along the lines of a recently developed multi-time scale Markov decision process (MMDP) framework and present numerical experiments wherein we use TD(0) and Q-learning algorithms with linear approximation architecture, and show comparisons of these with the policy iteration algorithm. We show numerical experiments under two different scenarios. In the first, transition probabilities are computed and used in the algorithms. In the second, transitions are simulated without explicitly computing the transition probabilities. We observe that TD(0) requires less computation than Q-learning. Moreover algorithms that use simulated transitions require significantly less computation than their counterparts that compute transition probabilities.
Keywords :
Markov processes; decision making; iterative methods; learning (artificial intelligence); probability; semiconductor device manufacture; Q-learning algorithms; TD(0) algorithms; capacity allocation; hierarchical decision making; linear approximation architecture; multi-time scale Markov decision process; numerical experiments; policy iteration algorithm; semiconductor fabs; switchover; transition probabilities; Approximation algorithms; Automation; Computational modeling; Computer architecture; Computer science; Costs; Decision making; Learning; Linear approximation; Measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2004. CDC. 43rd IEEE Conference on
ISSN :
0191-2216
Print_ISBN :
0-7803-8682-5
Type :
conf
DOI :
10.1109/CDC.2004.1429441
Filename :
1429441
Link To Document :
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