• DocumentCode
    4352
  • Title

    Crack Depth Estimation by Using a Multi-Frequency ECT Method

  • Author

    Bernieri, Andrea ; Betta, Giovanni ; Ferrigno, L. ; Laracca, Marco

  • Author_Institution
    Dept. of Electr. & Inf. Eng., Univ. of Cassino, Cassino, Italy
  • Volume
    62
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    544
  • Lastpage
    552
  • Abstract
    In many industrial application fields as manufacturing, quality control, and so on, it is very important to highlight, to locate, and to characterize the presence of thin defects (cracks) in conductive materials. The characterization phase tries to determine the geometrical characteristics of the thin defect namely the length, the width, the height, and the depth. The analysis of these characteristics allows the user in accepting or discarding realized components and in tuning and improving the production chain. The authors have engaged this line of research with particular reference to non-destructive testing applied to the conductive material through the use of eddy currents. They realized methods and instruments able to detect, locate, and characterize thin defects. In this paper, a novel measurement method able to improve the characterization of the crack depth is proposed. It is based on the use of a suitable multi-frequency excitation signals and of digital signal processing algorithms. Tests carried out in an emulation environment have shown the applicability of the method and have allowed the tuning of the measurement algorithm. Tests carried out in a real environment confirm the goodness of the proposal.
  • Keywords
    crack detection; eddy current testing; spatial variables measurement; conductive material; crack depth estimation; eddy current; multifrequency excitation signals; nondestructive testing; using a multifrequency ECT method; Eddy currents; Estimation; Frequency modulation; Materials; Probes; Skin; Defect depth estimation; GMR sensor; multi-frequency eddy current testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2232471
  • Filename
    6408116