Title :
Automated on-wafer measurement of noise figure and base spreading resistance
Author :
Connor, S.D. ; Harrington, S.J. ; Manson, A J ; Nigrin, S. ; Thomas, S. ; Wilson, M.C.
Author_Institution :
Zarlink Semicond. Ltd., Cheney Manor, UK
Abstract :
We present here details of a rapid modeling system (RMS). In particular the integration of automatic noise figure measurements (midband and high frequency) is described along with the software necessary to deliver statistical noise data and an alternative to ´S´ parameter base resistance extraction for noise sensitive design modeling.
Keywords :
S-parameters; circuit CAD; electric noise measurement; random noise; semiconductor device models; S parameter-base resistance extraction; automated on-wafer measurement; automatic noise figure measurements; base spreading resistance; noise sensitive design modeling; rapid modeling system; statistical noise; Electrical resistance measurement; Hardware; Noise figure; Noise measurement; Particle measurements; Probes; Radio frequency; Semiconductor device modeling; Semiconductor device noise; Synthetic aperture sonar;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1434979
