Title :
Lithography for sub<30 nm design rules: materials challenges
Author :
Nalamasu, Omkaram ; Ramanath, G. ; Lu, Toh-Ming
Author_Institution :
Dept. of Mater. Sci. & Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Paradigm shifts in resist materials design have kept pace with the demands of SIA roadmap and the needs of new lithographic technologies. Advances in resist materials, coupled with resolution enhancement technology have extended the resolution of optical lithography as the microelectronics officially entered the nanotechnology regime. Fundamental understanding is necessary to extend the limits of chemical amplification, design of resists for immersion lithography and for the realization of very fast and high-resolution resists for extreme ultraviolet (EUV) lithography.
Keywords :
nanolithography; photoresists; ultraviolet lithography; chemical amplification; extreme ultraviolet lithography; high-resolution resists; immersion lithography; microelectronics; nanotechnology; optical lithography; resist materials; resolution enhancement technology; Chemical technology; Lenses; Lithography; Materials science and technology; Microelectronics; Moore´s Law; Optical films; Optical materials; Optical sensors; Resists;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1435067