• DocumentCode
    435785
  • Title

    Lithography for sub<30 nm design rules: materials challenges

  • Author

    Nalamasu, Omkaram ; Ramanath, G. ; Lu, Toh-Ming

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    554
  • Abstract
    Paradigm shifts in resist materials design have kept pace with the demands of SIA roadmap and the needs of new lithographic technologies. Advances in resist materials, coupled with resolution enhancement technology have extended the resolution of optical lithography as the microelectronics officially entered the nanotechnology regime. Fundamental understanding is necessary to extend the limits of chemical amplification, design of resists for immersion lithography and for the realization of very fast and high-resolution resists for extreme ultraviolet (EUV) lithography.
  • Keywords
    nanolithography; photoresists; ultraviolet lithography; chemical amplification; extreme ultraviolet lithography; high-resolution resists; immersion lithography; microelectronics; nanotechnology; optical lithography; resist materials; resolution enhancement technology; Chemical technology; Lenses; Lithography; Materials science and technology; Microelectronics; Moore´s Law; Optical films; Optical materials; Optical sensors; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435067
  • Filename
    1435067