DocumentCode :
435793
Title :
Technology for three dimensional integrated system-on-a-chip
Author :
Kurino, Hiroyuki ; Koyanagi, Mitsumasa
Author_Institution :
Dept. of Bioeng. & Robotics, Tohoku Univ., Sendai, Japan
Volume :
1
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
599
Abstract :
We have proposed a wafer stacking technology to integrate various kinds of devices into 3D SoC. In 3D SoC each circuit layer is stacked and electrically connected vertically using a huge number of vertical interconnection. Hence, we can dramatically increase the wiring connectivity, reduce the number of long wiring and integrate various kinds of devices with different fabrication process sequences into one chip. In this paper, we describe a 3D microprocessor test chip consisting of three circuit layers and demonstrate the basic operation of the 3D microprocessor.
Keywords :
integrated circuit design; integrated circuit interconnections; microprocessor chips; system-on-chip; 3D integrated system-on-a-chip; 3D microprocessor test chip; circuit layer stacking; fabrication process sequence; vertical interconnection; wafer stacking technology; wiring connectivity; Circuit testing; Fabrication; Integrated circuit interconnections; Integrated circuit technology; Random access memory; Stacking; System-on-a-chip; Wafer bonding; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1435077
Filename :
1435077
Link To Document :
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