• DocumentCode
    435860
  • Title

    Studies of high field transport in GaN/AlGaN heterostructures

  • Author

    Barker, J.M. ; Ferry, D.K. ; Goodnick, S.M. ; Koleske, D.D. ; Allerman, A. ; Shul, R.J.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    3
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    2261
  • Abstract
    Experimental studies have been performed on the velocity-field characteristic of AlGaN/GaN heterostructures. A pulsed voltage input (with a 10 ns pulse width) in combination with a four-point measurement was used in a 50 Ω environment to determine the drift velocity of electrons in the two-dimensional electron gas as a function of the applied electric field. These measurements show an apparent saturation velocity near 3.1 × 107 cm/s, at a field of 140 kV/cm. A comparison of these studies shows that the experimental velocities are close to previously published simulations based upon Monte Carlo techniques. Local inhomogeneities in the electric field are discussed as possible mechanisms for the slightly lower value of the velocity as compared to the simulation.
  • Keywords
    aluminium compounds; electric field measurement; gallium compounds; high electron mobility transistors; power HEMT; two-dimensional electron gas; 10 ns; 50 ohm; GaN-AlGaN; GaN/AlGaN heterostructures; apparent saturation velocity; applied electric field; electron drift velocity; four-point measurement; high field transport; local inhomogeneities; pulsed voltage input; two-dimensional electron gas; velocity-field characteristic; Aluminum gallium nitride; Electric variables measurement; Electron mobility; Gallium nitride; Monte Carlo methods; Nonuniform electric fields; Pulse measurements; Space vector pulse width modulation; Velocity measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435295
  • Filename
    1435295