• DocumentCode
    435920
  • Title

    3D-IC performance computing of single-gate SOI CMOS inverter

  • Author

    Wenshi, Li ; Yan, Zhang ; Heming, Zhao ; Qi-An, Xu

  • Author_Institution
    Dept. of Microelectron., Suzhou Univ., China
  • Volume
    2
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    1046
  • Abstract
    Based on Elmore delay model and 3D-IC interconnection model and 2003 ITRS, we compute two parameters of interconnection time delay (TN) and power delay product (PDP) in which facing 3D-IC (N gates and m device layers) of single-gate SOI CMOS inverter and running VC++ and Excel. TN and PDP are constructed in case of a 3D-IC net with both horizontal and vertical wire. A major focus on analyzing TN and PDP is given by finding their non-line factors β1, β2 and β3 which result mainly from the vertical wire contribution. The parabola-shape β1 of TN can reveal that TN has minimum when m = 6 - 8. The flat peak parabola-shape β2 of PDP´s dynamic component (about netload C. Vdd and felk) can be observed when 2003 ITRS is in 90nm-22nm technology nodes. The semi-U-shape β3 of PDP´s static component (about Ioff and Vdd) can reveal that PDP has minimum when in 90nm-45nm technology nodes. To sum up, in 90nm-45nm technology nodes of 2003 ITRS, when device layers m = 6 - 8, then TN and PDP of 3D-IC net have their minimum.
  • Keywords
    CMOS integrated circuits; delay circuits; integrated circuit interconnections; invertors; logic gates; silicon-on-insulator; 3D-IC interconnection model; 3D-IC performance computing; 90 to 22 nm; Elmore delay model; Excel; ITRS; PDP; VC++; interconnection time delay; power delay product; single-gate SOI CMOS inverter; CMOS technology; Delay effects; Inverters; Microelectronics; Semiconductor device modeling; Table lookup; Three-dimensional integrated circuits; Tungsten; Ultra large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1436685
  • Filename
    1436685