Title :
Elmore delay estimation of two adjacent coupling interconnects
Author :
Gang, Dong ; Yintang, Yang ; Yuejin, Li
Author_Institution :
Inst. of Microelectron., Xidian Univ., China
Abstract :
An approach to analyze coupling RC interconnect delay based on "effective capacitance" is presented in this paper. We compare this new method with the traditional method that uses Miller capacitance. Results show that it not only improves the accuracy but also reflects the delay dependence on rise time. The method has the same complexity as the Elmore delay and can be widely used in performance-driven routing optimization.
Keywords :
RC circuits; capacitance; coupled circuits; delay estimation; integrated circuit interconnections; Elmore delay estimation; adjacent coupling interconnects; coupling RC interconnect delay; effective capacitance; Capacitance; Circuit noise; Computational modeling; Coupling circuits; Delay estimation; Geometry; Integrated circuit interconnections; Optimization methods; Routing; Signal analysis;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1436700
