DocumentCode
435986
Title
Power management for modern VLSI loads using dynamic voltage scaling
Author
Ng, Wai Tung ; Trescases, Olivier
Author_Institution
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Volume
2
fYear
2004
fDate
18-21 Oct. 2004
Firstpage
1412
Abstract
Modern deep sub-micron MOS devices suffer from a significant amount of DC leakage power dissipation due to the tunneling current across the ultra-thin gate oxide and off-state drain to source leakage, etc. In this paper, a dynamic voltage scaling (DVS) technique is demonstrated experimentally to provide an automated real-time control of the supply voltage according to the required VLSI core clock frequency. The DVS scheme is made practical with the use of a high efficiency sort-switching DC-DC converter and an on-chip frequency-to-voltage control loop. Using a 0.1 μm CMOS CPLD chip to serve as a typical VLSI load, a power saving of greater than 50% at 0.6 times the maximum clock frequency was observed. This DVS architecture is suitable for managing the power consumption of modern VLSI chips where the demand on processing rate varies constantly.
Keywords
CMOS integrated circuits; DC-DC power convertors; VLSI; leakage currents; voltage control; 0.1 micron; CMOS CPLD chip; DC leakage power dissipation; VLSI core clock frequency; VLSI load; automated real-time control; dynamic voltage scaling; on-chip frequency-to-voltage control loop; power management; sort-switching DC-DC converter; submicron MOS device; supply voltage; Automatic voltage control; Clocks; Dynamic voltage scaling; Energy management; Frequency; MOS devices; Power dissipation; Tunneling; Very large scale integration; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN
0-7803-8511-X
Type
conf
DOI
10.1109/ICSICT.2004.1436833
Filename
1436833
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