DocumentCode :
435986
Title :
Power management for modern VLSI loads using dynamic voltage scaling
Author :
Ng, Wai Tung ; Trescases, Olivier
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Volume :
2
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
1412
Abstract :
Modern deep sub-micron MOS devices suffer from a significant amount of DC leakage power dissipation due to the tunneling current across the ultra-thin gate oxide and off-state drain to source leakage, etc. In this paper, a dynamic voltage scaling (DVS) technique is demonstrated experimentally to provide an automated real-time control of the supply voltage according to the required VLSI core clock frequency. The DVS scheme is made practical with the use of a high efficiency sort-switching DC-DC converter and an on-chip frequency-to-voltage control loop. Using a 0.1 μm CMOS CPLD chip to serve as a typical VLSI load, a power saving of greater than 50% at 0.6 times the maximum clock frequency was observed. This DVS architecture is suitable for managing the power consumption of modern VLSI chips where the demand on processing rate varies constantly.
Keywords :
CMOS integrated circuits; DC-DC power convertors; VLSI; leakage currents; voltage control; 0.1 micron; CMOS CPLD chip; DC leakage power dissipation; VLSI core clock frequency; VLSI load; automated real-time control; dynamic voltage scaling; on-chip frequency-to-voltage control loop; power management; sort-switching DC-DC converter; submicron MOS device; supply voltage; Automatic voltage control; Clocks; Dynamic voltage scaling; Energy management; Frequency; MOS devices; Power dissipation; Tunneling; Very large scale integration; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1436833
Filename :
1436833
Link To Document :
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