DocumentCode
436692
Title
Short course presenters
fYear
2003
fDate
15-19 Sept. 2003
Keywords
Charge coupled devices; Circuit testing; Electronic equipment testing; Integrated circuit modeling; Nonlinear optics; Observatories; Optical materials; Physics; Radiation effects; Sensor arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442355
Link To Document